Top 10 brukerafmprobes.com Competitors

nanoandmore.com

Same mechanical properties as OLYMPUS** AC160 - Optimized positioning through maximized tip visibility NanoWorld Arrow™ ACR AFM probes have the same mechanical properties as the discontinued OLYMPUS** AC160 microcantilevers and are designed for non-contact or tapping™ mode imaging in air.NanoWorld Arrow™ ACR AFM probes are general purpose AFM tips that can be used as a direct replacement for OLYMPUS** AC160 AFM probes for materials science applications. Due to their moderate stiffness these probes may be used for investigating relatively soft materials such as some polymers. In general, they are designed for non-contact or Tapping™ mode in air to characterize thin films, coatings, surface roughness, or local defects.This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.

spmtips.com

Browse our list of Frequently Asked Questions (FAQ) or contact MikroMasch Support Team if you need to know anything specific. We are happy to assist you!

afm.oxinst.com

AFM imaging can be used for nanomechanical measurements. Used as a nanotechnology tool, AFM lets you measure nanoscale properties.

parksystems.com

Park Systems Corporation

sfr.ca

Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the ChipThis competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge tip overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm macroscopic half cone angle of 35°450 micron thick silicon holder chip AFM Tip SHAPE Pyramid Tip Height 12µm - From 10µm To 14µm Tip Radius < 15nm Half Cone Angle 35° (macroscopic) Cantilever A - Contact Mode Cantilever B - Force Modulation Shape Triangle Shape Beam Force Constant 0.27 Force Constant 0.06N/m Resonance Frequency 30kHz Resonance Frequency 10kHz Length 100µm - From 90µm To 110µm Length 200µm - From 190µm To 210µm Width 16µm - From 11µm To 21µm Width 30µm - From 25µm To 35µm Thickness 0.52µm - From 0.47µm To 0.57µm Thickness 0.52µm - From 0.47µm To 0.57µm

rdec.co.jp

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bruker-nano.jp

ブルカージャパン(株) ナノ表面計測事業部は、物質材料の研究開発，品質管理のためのナノ表面計測 (afm/spm)のリーディングカンパニーです。原子間力顕微鏡、走査型プローブ顕微鏡、白色光干渉粗さ計、スタイラスプロファイラー,摩擦摩耗試験機、トライボロジー、メカニカル試験機、ナノインデンテーションなど幅広いラインナップを提供しています。

nanolab.polimi.it

the micro and nanostructured materials lab (nanolab) is located at politecnico di milano, italy. the lab research activity is devoted to the synthesis and characterization of nanostructured films and surfaces, clusters and nanostructures.

directelectron.com

1.46 Å resolution cryo-EM structure of apoferritin (EMD-33707) from Apollo on a JEOL CRYO ARM 300 II, acquired at 12 e-/physical pixel/s (eps).

ebsd.com

Find out about the various sample preparation recipes that you can use for your EBSD analysis depending on the sample materials