tedpella.com的 10 大竞争对手

emsdiasum.com

ems is the most comprehensive source of high-quality products in all fields of microscopy & general laboratory research. browse our site today by product type.

2spi.com

All SEM sample surfaces are typically coated with a thin hydrocarbon contamination due to sample preparation or storage. This contamination can affect and inhibit good resolution of the sample surface, especially in a FE-SEM. The UV Prep for SEM is the optimal system for the removal of this thin hydrocarbon film without affecting the sample itself. When stored in an open environment, samples pick up contamination through the air. Unless they are handled carefully, they will also pick up contamination through handling. The UV Prep for SEM is designed to mitigate or eliminate these effects. Why is it so important to remove this contamination prior to examination? Typical FE-SEM users are running at lower and lower beam energies. The lower the beam energy, the more sample surface detail is imaged. That same sample surface that has contaminants on it. If not removed, the user is actually imaging the contaminants, and not the true sample surface. Many times, when focusing at high magnification in order to perform analysis or capture images at lower magnification, a "black box" can be formed on the sample. In many cases, this is caused by raster burn or electron beam induced deposition (EBID) not of the sample, but of the hydrocarbon contaminants on the sample surface. Removing these hydrocarbons from the surface prior to analysis with the UV Prep for SEM can greatly reduce the appearance of this black box effect. Many users purchase new FE-SEMs in order to take advantage of their unique operating abilities (high resolution imaging at very low kV). What they don not realize is that the only way to obtain the advertised resolution of the microscope is to start with a clean sample. Even the best microscopes in the world will give poor images of dirty samples! Look through our gallery to see how the UV Prep for SEM really can enhance the image quality of a variety of materials under many conditions.

microtonano.com

micro to nano is the first truly european company for all your supplies, calibration standards, sample preparation tools and consumables for electron microscopy, sem, fib, tem, afm and light microscopy. here you will find practical and innovative products against competitive pricing with a wide range of sem sample stubs, sample holders, fib grids, tem support films and unique calibration tools.

laddresearch.com

225 ml

proscitech.com.au

Abrasives and polishing materials for sample preparation, including alumina, diamond paste, suspensions, and lapping compounds. Suitable for metallography, EM, and precision finishing - ProSciTech

jeol.com

JEOL's product information. JEOL is a global leader in TEM, SEM, NMR, MS and other.scientific/medical/semiconductor/industrial instruments.

nanoandmore.com

Learn about different AFM support chips available on the market

scienceservices.eu

Science Services

estore.oxinst.com

order high quality consumables and electrical spares and consumables for your system. same day dispatch for orders placed before 12pm local time

agarscientific.com

Circular hole, size 0.6µm dia, separation 1µm.